Journal of Environmental Biology

Influence of residual silicon and phosphorus on growth, productivity, lodging and grain quality of succeeding wheat under rice-wheat cropping system

D. Jinger¹*, S. Dhar², A. Dass², V.K. Sharma³, V. Kumar S.⁴ and G. Gupta⁵ 

¹Division Soil Science and Agronomy, ICAR-Indian Institute of Soil and Water Conservation, Research Centre-Vasad, Anand-388 306, India

²Division of Agronomy, ICAR-Indian Agricultural Research Institute, New Delhi-110 012, India

³Division of SSAC, ICAR-Indian Agricultural Research Institute, New Delhi-110 012, India

⁴Division of Crop Production, ICAR-National Rice Research Institute, Cuttack-753 006, India

⁵Division of Social Sciences, ICAR-Indian Grassland and Fodder Research Institute, Jhansi- 284 003, India

*Corresponding Author Email : dineshjinger28@gmail.com ??????

Paper received: 13.06.2020 ?????? ???????????????????????????????????????Revised received: 03.10.2020 ???????????? ???????????????????????????????????????????Accepted: 30.10.2020

Abstract

Aim: To assess the residual effect of silicon (Si) and phosphorus (P2O5) application on the growth, productivity, lodging resistance and grain quality of wheat in Indo-Gangetic Plains of India.

Methodology: A field experiment was conducted with four levels each of silicon (0, 40, 80 and 120 kg Si ha^-1) and phosphorus (0, 30, 60 and 90 kg P₂O₅ ha^-1) in a factorial randomized block design (FRBD) replicated three times at research farm of the ICAR-Indian Agricultural Research Institute, New Delhi during 2015-16 and 2016-17 to study the residual effect of Si and P2O5 on wheat. Growth, yield, yield attributes, lodging and grain quality parameters were analyzed using standard procedures. Both the nutrients were applied in aerobic rice crop and their residual effect was studied in wheat crop.

Results: Application of Si and P₂O₅ in preceding rice crop significantly improved the growth, yield, grain quality of succeeding wheat crop. Grain yield of wheat was increased by 21% due to application of Si and P₂O₅. Significant improvement was observed when P2O5 and Si were applied at 60 and 80 kg ha^-1, respectively. Lodging was reduced by 100% with P₂O₅ and Si application at 90 and 120 kg ha^-1, respectively.      

Interpretation: Application of Si and P₂O₅ has potential to enhance productivity by improving growth, yield attributes and reduction in abiotic stress like lodging. Fertilization with P₂O₅ and Si can reduce lodging and improve wheat grain quality through enhanced sturdiness and protein content.          

Key words: Growth, lodging, phosphorus, silicon, residual effect, wheat

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